Testdie

Test die-TE01, 1.25 Gb/s (per signal line) Switch IC, 0.5 um CMOS

Test die-TE02, 2.0 Gb/s (per signal line, 32 Gb/s aggregate) Switch IC, 0.5 um CMOS

Test die-BUSY #1, 3.0 Gb/s Isolated BUSY BIT test IC 0.25 um CMOS

Test die-TIA, 2.5 Gb/s (22 uA input sensitivity, 200 fF load) Analog TIA, 0.35 um CMOS